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Simple measurement of lifetimes of prompt and delayed fluorescence in the range of 10 ns to μs to ms to s.
- Real-time measurement using high-speed optical detectors and oscilloscopes - Compact design using a small pulse laser - Capable of near-infrared emission - Spectrometer option
![[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement](https://image.mono.ipros.com/public/product/image/507/2000958389/IPROS45996472034572179014.jpeg?w=280&h=280)
Insights into the carrier lifetime of SiC can be obtained from the luminous lifetime.
Carrier lifetime refers to the time it takes for minority carriers among the excess carriers generated during the operation of electronic devices to decay to 1/e. Proper control of this is important for managing the electrical characteristics of the device. On the other hand, luminescence lifetime indicates the time until the luminescence intensity from the sample reaches 1/e, and it can be calculated from the luminescence decay curve. Since some minority carriers emit light during recombination, it is possible to indirectly evaluate the carrier lifetime from luminescence lifetime measurements. This document presents a case study on the evaluation of carrier lifetime for 4H-SiC epitaxial substrates. Measurement method: Fluorescence lifetime measurement Product fields: Power devices, LSI/memory, electronic components Analysis purposes: Failure analysis, defect analysis, product investigation, carrier lifetime, process evaluation For more details, please download the document or contact us.
High-efficiency digital measurement. Lifespan spectrum and waveform file storage are possible!
Integration of measurement and power supply equipment necessary for positron annihilation method measurements that can analyze molecular-level nanoscale spatial structures. Settings and data reading for each module are performed via a network from a dedicated application installed on a computer. PALS captures and calculates high-speed pulse signals from two BaF2 scintillation detectors using a 3 Gsps module. CDB takes coincidences from two germanium semiconductor detectors and generates a two-dimensional histogram from each of their pulse height values. Furthermore, the combination of these devices also enables the measurement of the correlation between lifetime and momentum using AMOC.
A fluorescence lifetime measurement device that also features TCSPC functionality, capable of femtosecond, picosecond, nanosecond, and microsecond measurements.
HALCYONE is a user-friendly up-conversion fluorescence measurement device. It is housed on a compact breadboard measuring 610 × 915 mm and consists of a mirror, filter, BBO crystal, photomultiplier tube, and an automated spectrometer with a delay stage. In up-conversion mode, it allows for easy measurement of fluorescence lifetime with a laser pulse width multiplied by 1.4, and in TCSPC mode, it offers a time resolution of 200 ps. With the optional automatic crystal angle adjustment feature, time-resolved fluorescence spectra can also be obtained.
